Peer Review History: Enhanced Security and Efficiency in Attendance Management: A Novel RFID and Arduino Integrated System

Editor(s):

(1) Dr. Jichao Sun, Associated Professor, China University of Geosciences, Beijing, China.

Reviewers:

(1) Ali H. Wheeb, College of Engineering, University of Baghdad, Iraq.

(2) Canute Sherwin, Atria University, India.

Additional Reviewers:

(1) Bilal Abdullah Nasir, Northern Technical University, Iraq.

(2) Yusuf Suryo Utomo, Indonesia.

Additional Reviewers: (Comments received after deadline)

(1) Agzamov Mirkhosil Mirsalikhovich, Tashkent Institute of Textile and Light Industry, Uzbekistan.

(2) Anak Agung Ngurah Gunawan, Universitas Udayana, Indonesia.

(3) S Arulmozhi, Sri Venkateswara College of Engineering, Anna University, India.

Open Peer Review Policy: Click Here

Specific Comment:

Average Peer review marks at initial stage: 8.4/10

Average Peer review marks at publication stage: 9/10

Peer Review History:


Stage 1 | Original Manuscript | File 1 | NA


Stage 2 | Peer Review Report_1 (Ali H. Wheeb, Iraq) | File 1 | NA


Stage 2 | Peer Review Report_2 (Canute Sherwin, India) | File 1 | NA


Stage 2 | Revised_MS_v1_and_Feedback_v1 | File 1 | File 2


Stage 3 | Comment_Editor_1_v1 | File 1 | NA


Posted in Review History.