Peer Review History: Reduction of Defect Rate in Biscuit Production using Statistical Quality Control Process

Editor(s):

(1) Dr. Danilo Costarelli, University of Perugia, Italy.

Reviewers:

(1) V. Nirmala, Sri Krishna Arts and Science College, India.

(2) Rini Alfatiyah, Pamulang University, Indonesia.

Additional Reviewers:

(1) Caren Babu, Christ College of Engineering, India.

(2) Fausto Galetto, Italy.

(3) Jyoti U. Devkota, Kathmandu University, Nepal.

(4) You Huay Woon, Universiti Kebangsaan Malaysia, Malaysia.

Open Peer Review Policy: Click Here

Specific Comment:

Average Peer review marks at initial stage: 8/10

Average Peer review marks at publication stage: 9/10

Peer Review History:


Stage 1 | Original Manuscript | File 1 | NA


Stage 2 | Peer review report_1 (V. Nirmala, India) | File 1 | NA


Stage 2 | Peer review report_2 (Rini Alfatiyah, Indonesia) | File 1 | NA


Stage 2 | Revised_MS_v1_and_Feedback_v1 | File 1 | File 2


Stage 3 | Comment_Editor_1_v1 | File 1 | NA


Posted in Review History.