Peer Review History: Innovative and Robust Application of Automation for Unit Level Traceability on Dual Die configuration of Micro Electromechanical System Products

Editor(s):

(1) Dr. Grzegorz SierpiƄski, Silesian University of Technology, Poland.

Reviewers:

(1) Atishey Mittal, National Institute of Technology, Kurukshetra, India.

(2) Tan Wei Hong, Universiti Malaysia Perlis (UniMAP), Malaysia.

Additional Reviewers:

 

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Specific Comment:

Average Peer review marks at initial stage: 9.2/10

Average Peer review marks at publication stage: 9/10

Peer Review History:


Stage 1 | Original Manuscript | File 1 | NA


Stage 2 | Peer review report_1 (Atishey Mittal, India) | File 1 | NA


Stage 2 | Peer review report_2 (Tan Wei Hong, Malaysia) | File 1 | NA


Stage 2 | Revised_MS_v1_and_Feedback_v1 | File 1 | File 2


Stage 3 | Comment_Editor_1_v1 | File 1 | NA


 

Posted in Review History.