Peer Review History: In-Depth Review and Analysis for the Applications and Manufacturing of NFRPCs

Editor(s):

(1) Prof. (Dr.) Yong X. Gan, Professor, California State Polytechnic University, Pomona, USA.

Reviewers:

(1) Ali Anvari, University of Missouri, United States of America.

(2) U. Tamilarasan, Sri Sairam Engineering College, India.

Additional Reviewers:

(1) Rokhsana  Mohammed  Ismail, University of Aden, Republic of Yemen.

Additional Reviewers: (Comments received after deadline)

(1) Raj Kishor Pradhan, NIFS, India.

(2) Ali Ihsan Kaya, Mehmet Akif  Ersoy University, Turkey.

Open Peer Review Policy: Click Here

Specific Comment:

Average Peer review marks at initial stage: 8/10

Average Peer review marks at publication stage: 9/10

Peer Review History:


Stage 1 | Original Manuscript | File 1 | NA


Stage 2 | Peer review report_1 (Ali Anvari, United States of America) | File 1 | NA


Stage 2 | Peer review report_2 (U. Tamilarasan, India) | File 1 | NA


Stage 2 | Revised_MS_v1_and_Feedback_v1 | File 1 | File 2


Stage 3 | Comment_Editor_1_v1 | File 1 | NA


Posted in Review History.