Editor(s):
(1) Dr. Chong Leong, Gan, Director, Micron Technology Inc., Taiwan.
(2) Prof. Yong X. Gan, California State Polytechnic University, Pomona, USA.
Reviewers:
(1) Shankramma K, JSS AHER, India.
(2) Rajendra S. Dongre, RTM Nagpur University, India.
(3) K. Jeyalakshmi, PSNA College of Engineering and Technology, India.
(4) V. Vijayan, K. Ramakrishnan College of Technology, India.
Additional Reviewers:
Additional Reviewers: (Comments received after deadline)
Open Peer Review Policy: Click Here
Specific Comment:
Average Peer review marks at initial stage: 7.75/10
Average Peer review marks at publication stage: 9/10
Peer Review History:
Stage 1 | Original Manuscript | File 1 | NA
Stage 2 | Peer Review Report_1 (Shankramma K, India) | File 1 | NA
Stage 2 | Peer Review Report_2 (Rajendra S. Dongre, India) | File 1 | NA
Stage 2 | Peer Review Report_3 (K. Jeyalakshmi, India) | File 1 | NA
Stage 2 | Peer Review Report_4 (V. Vijayan, India) | File 1 | NA
Stage 2 | Revised_MS_v1_and_Feedback_v1 | File 1 | File 2
Stage 3 | Comment_Editor_1_v1 | File 1 | NA
Stage 3 | Comment_Editor_2_v1 | File 1 | NA